Reference Documents

Phasor Application Classification
/sites/default/files/reference_documents/phasorapplicationclassification_20080807.xls
NASPI Phasor Gateways and Their Relationship to Phasor Data Concentrators
/sites/default/files/reference_documents/77.doc
Statement of Work Specification for NASPI
/sites/default/files/reference_documents/78.pdf
Quanta Statement of Work, Specification for NASPInet
/sites/default/files/reference_documents/quanta_sow.pdf
NASPI Research Project Repository
/sites/default/files/reference_documents/79.pdf
Phasor Application Classification
/sites/default/files/reference_documents/80.xls
Assessment of Application Taxonomy
/sites/default/files/reference_documents/assessment_of_application_taxonomy.pdf
Assessment of Application Taxonomy
/sites/default/files/reference_documents/assessment_of_application_taxonomy.doc
PRSTT: A Guide for PMU Installation, Commissioning, and Maintenance; Part II
/sites/default/files/reference_documents/81.pdf
NASPI Planning Committee Presentation on Data Management
/sites/default/files/reference_documents/82.pdf
Architecture Template
/sites/default/files/reference_documents/logical_arch_template.doc
Phasor Applications Taxonomy, Version 2a
/sites/default/files/reference_documents/phasor_applications_taxonomy2a.xls
California Institute for Energy and Environment (CIEE) Phasor Measurement Application Study
/sites/default/files/reference_documents/ciee_pmufinalreport_october06.pdf
Phasor Applications Taxonomy
/sites/default/files/reference_documents/83.xls
PRSTT: A Guide for PMU Installation, Commissioning, and Maintenance; Part I
/sites/default/files/reference_documents/84.pdf
Appendix A through F Version 4
/sites/default/files/reference_documents/appendix_a-f_v4.pdf
Mar 21 2017
EPG's Template
/sites/default/files/reference_documents/NASPI_SCADA_vs_PMU_Data_Playback_Information_-_Template_rev2_0.docx
Apr 6 2017
EPG Synchrophasor Data File Format (.CSV)
/sites/default/files/reference_documents/epg_synchrophasor_data_file_format_csv_0.pdf
Apr 6 2017
Resources contributed by Luigi Vanfretti
May 17 2017
Pure and applied metrology
May 17 2017